SemiConductor Devices

Year 2007

3D simulation of detector parameters for backside illuminated InSb 2-D arrays

Tal Fishman, Vered Nahum, Erez Saguy, Zippora Calahorra, Itay Shtrichman SemiConductor Devices (SCD), P.O. Box 2250, Haifa 31021, Israel

BIRD640: SCD's High Sensitivity VGA VOx μ-Bolometer Detector

A. Fraenkel, U. Mizrahi, L. Bikov, A. Giladi, A. Adin, N. Shiloah, E. Malkinson, T. Czyzewski, A. Amsterdam, and Y. Sinai SemiConductor Devices (SCD), P.O. Box 2250, Haifa 31021, Israel

Large Format and High Sensitivity VOx μ-Bolometer Detectors at SCD

U. Mizrahi, L. Bikov, A. Giladi, A. Adin, N. Shiloah, E. Malkinson, T. Czyzewski, D. Seter, A. Amsterdam, Y. Sinai and A. Fraenkel Semi Conductor Devices (SCD), P.O. Box 2250, Haifa 31021, Israel

Pelican – SCD's 640×512/15 μm pitch InSb detector

J. Oiknine Schlesinger, Z. Calahorra, E. Uri, O. Shick, T. Fishman, I. Shtrichman, E. Sinbar, V. Nahum, E. Kahanov, B. Shlomovich, S. Hasson, N. Fishler, D. Chen, T. Markovitz SemiConductor Devices (SCD), P.O. Box 2250, Haifa 31021, Israel

Spatial resolution of SCD's InSb 2D detector arrays

Itay Shtrichman, Tal Fishman, Udi Mizrahi, Vered Nahum, Zippora Calahorra, Yoram Arona SemiConductor Devices (SCD), P.O. Box 2250, Haifa 31021, Israel
a ELOP, P.O. Box 1165, Rehovot 76111, Israel
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