SemiConductor Devices

Year 2008

"XBn" Barrier Photodetectors for High Sensitivity and High Operating Temperature Infrared Sensors

Philip Klipstein Semiconductor Devices, P O Box 2250, Haifa 31021, ISRAEL

New Features and Development Directions in SCD's μ-Bolometer Technology

U. Mizrahi, L. Bikov, A. Giladi, A. Adin, N. Shiloah, E. Malkinson, T. Czyzewski, A. Amsterdam, Y. Sinai and A. Fraenkel SemiConductor Devices (SCD), P.O. Box 2250, Haifa 31021, Israel
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