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    Backside Illuminated CMOS-TDI Line Scanner for Space Applications

    A new multi-spectral line scanner CMOS image sensor is reported. The backside illuminated (BSI) image sensor was designed for continuous scanning Low Earth Orbit (LEO) space applications including A custom high quality CMOS Active Pixels, Time Delayed Integration (TDI) mechanism that increases the SNR, 2-phase exposure mechanism that increases the dynamic Modulation Transfer Function (MTF), very low power internal Analog to Digital Converters (ADC) with resolution of 12 bit per pixel and on chip controller. The sensor has 4 independent arrays of pixels where each array is arranged in 2600 TDI columns with controllable TDI depth from 8 up to...
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    • O. Cohen
    • N. Ben-Ari
    • I. Nevo
    • N. Shiloah
    • G. Zohar
    • E. Kahanov
    • M. Brumer
    • G. Gershone
    • O. Ofer

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